• DocumentCode
    3463736
  • Title

    A 20/10/5/2.5Gb/s Power-scaling Burst-Mode CDR Circuit Using GVCO/Div2/DFF Tri-mode Cells

  • Author

    Liang, Che-Fu ; Liu, Shen-Iuan

  • Author_Institution
    Nat. Taiwan Univ., Taipei
  • fYear
    2008
  • fDate
    3-7 Feb. 2008
  • Firstpage
    224
  • Lastpage
    608
  • Abstract
    PON is one of the promising solutions for the last-mile communication systems. In PONs, the fast-locked CDR circuit must lock within tens of bit times once the data packets arrive. The so-called burst-mode CDR (BMCDR) circuits with gated VCOs (GVCOs) have been presented. To meet the requirements of different PON standards, a multi-band BMCDR circuit is very desirable. The conventional multi-band technique is realized by a GVCO with dividers. Since the GVCO has to operate at the highest speed, it dissipates a fixed power, even though only a low data rate is required. Furthermore, the dividers introduce extra time delays to reduce the sampling margin that may become an issue for high data rates. In this work, a 20/10/5/2.5Gb/s power-scaling BMCDR circuit is implemented in 90nm CMOS technology. It is aimed to scale the power of a BMCDR circuit for different data rates. To realize a power-scaling multi-band BMCDR circuit, a tri-mode cell can be configured as a GVCO, a divide-by-2 divider, or 2 DFFs. Moreover, improvements are made to address the problem associated with the extra time delays that reduce the sampling margin.
  • Keywords
    CMOS integrated circuits; optical burst switching; optical fibre networks; voltage-controlled oscillators; CMOS technology; GVCO/Div2/DFF tri-mode cells; PON standards; bit rate 10 Gbit/s; bit rate 2.5 Gbit/s; bit rate 20 Gbit/s; bit rate 5 Gbit/s; data packets; fast-locked CDR circuit; gated voltage controlled oscillator; multiband BMCDR circuit; passive optical network; power-scaling burst-mode CDR circuit; size 90 nm; CMOS logic circuits; Clocks; Delay effects; Latches; Logic circuits; Multiplexing; Phase locked loops; Sampling methods; Semiconductor device measurement; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-2010-0
  • Electronic_ISBN
    978-1-4244-2011-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2008.4523138
  • Filename
    4523138