DocumentCode :
3463769
Title :
A 40Gb/s CDR with Adaptive Decision-Point Control Using Eye-Opening-Monitor Feedback
Author :
Noguchi, Hidemi ; Yoshida, Nobuhide ; Uchida, Hiroaki ; Ozaki, Manabu ; Kanemitsu, Shunichi ; Wada, Shigeki
Author_Institution :
NEC, Kawasaki
fYear :
2008
fDate :
3-7 Feb. 2008
Firstpage :
228
Lastpage :
609
Abstract :
In high-speed data link systems of over 40Gb/s, the data decision point in the CDR circuit is not often the optimum position of the eye diagram. The CDR circuit is fabricated using a 0.18 mum SiGe BiCMOS process. The ft and fmax are 200 GHz and 180 GHz, respectively. To overcome a severe degradation of BER performance due to this misalignment, a 40 Gb/s CDR circuit integrated with an adaptive decision-point control scheme by using an eye-opening monitor feedback is developed. The key approaches are 40 Gb/s high-precision eye-opening monitor (EOM) circuit to detect an optimum decision point, an adaptive decision-point control (ADPC) scheme by using the EOM feedback, a decision- point adjustable self-aligned phase detector to achieve the ADPC operation. The combination of these approaches improves both the BER performance and the stability of CDR operation.
Keywords :
BiCMOS digital integrated circuits; Ge-Si alloys; circuit feedback; phase detectors; ADPC operation; BER performance; CDR circuit fabrication; CDR circuit integration; EOM feedback; Si-Ge; SiGe BiCMOS process; adaptive decision-point control scheme; bit rate 40 Gbit/s; clock-and-data recovery circuit; decision-point adjustable self-aligned phase detector; frequency 180 GHz; frequency 200 GHz; high-speed data link systems; size 0.18 mum; Adaptive control; BiCMOS integrated circuits; Bit error rate; Feedback circuits; Germanium silicon alloys; Monitoring; Phase detection; Programmable control; Signal analysis; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
Electronic_ISBN :
978-1-4244-2011-7
Type :
conf
DOI :
10.1109/ISSCC.2008.4523140
Filename :
4523140
Link To Document :
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