• DocumentCode
    3463771
  • Title

    Optical Fault Attacks on AES: A Threat in Violet

  • Author

    Schmidt, Jörn-Marc ; Hutter, Michael ; Plos, Thomas

  • Author_Institution
    Inst. for Appl. Inf. Process. & Commun., Graz Univ. of Technol., Graz, Austria
  • fYear
    2009
  • fDate
    6-6 Sept. 2009
  • Firstpage
    13
  • Lastpage
    22
  • Abstract
    Microprocessors are the heart of the devices we rely on every day. However, their non-volatile memory, which often contains sensitive information, can be manipulated by ultraviolet (UV) irradiation. This paper gives practical results demonstrating that the non-volatile memory can be erased with UV light by investigating the effects of UV-Clight with a wavelength of 254 nm on four different depackaged microcontrollers. We demonstrate that an adversary can use this effect to attack an AES software implementation by manipulating the 256- bit S-box table. We show that if only a single byte of the table is changed, 2 500 pairs of correct and faulty encrypted inputs are sufficient to recover the key with a probability of 90%, in case the key schedule is not modified by the attack. Furthermore, we emphasize this by presenting a practical attack on an AES implementation running on an 8-bit microcontroller. Our attack involves only a standard decapsulation procedure and the use of alow-cost UV lamp.
  • Keywords
    cryptography; microcontrollers; random-access storage; ultraviolet radiation effects; AES; Advanced Encryption Standard; key schedule; microcontrollers; microprocessors; nonvolatile memory; optical fault attacks; probability; ultraviolet irradiation; Cryptography; Fault diagnosis; Fuses; Heart; Microcontrollers; Microprocessors; Nonvolatile memory; Optical devices; Protection; Security; AES; Fault Analysis; Implementation Attacks; UV-C; Ultraviolet Light;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault Diagnosis and Tolerance in Cryptography (FDTC), 2009 Workshop on
  • Conference_Location
    Lausanne
  • Print_ISBN
    978-1-4244-4972-9
  • Type

    conf

  • DOI
    10.1109/FDTC.2009.37
  • Filename
    5412863