DocumentCode :
346402
Title :
1200 V, 50 A Trench Oxide PiN Schottky (TOPS) diode
Author :
Chang, H.-R. ; Winterhalter, C. ; Gupta, R. ; Humphrey, K.D.
Author_Institution :
Rockwell Sci. Center, Thousand Oaks, CA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
353
Abstract :
A novel high voltage rectifier, called the Trench Oxide PiN Schottky (TOPS) rectifier, is described in this paper. The TOPS rectifier is a synergistic combination of a Schottky rectifier and a P +iN diode, using a trench oxide structure to achieve high aspect ratio P+ regions, which permits a superior trade-off between forward voltage drop and switching characteristics, as compared with SSD (Static Shielding Diode), P--i-N, and P+-i-N rectifiers, white maintaining an excellent blocking capability. A reverse leakage current of 100 nA was measured at 1200 V for a high current TOPS rectifier (die area=0.5 cm2), which is comparable to that in a P+IN diode. TOPS rectifiers with different Schottky/P+ ratios, SSD, P--i-N, and P +-i-N rectifiers were fabricated using punch-through (EPI) wafers. The reverse recovery characteristics of the TOPS rectifier has a much smaller peak reverse recovery current IRP than those in the SSD and P+-i-N rectifiers. The stored charge Qrr in the TOPS rectifier is smaller than that in the P--i-N rectifier
Keywords :
Schottky diodes; isolation technology; leakage currents; p-i-n diodes; solid-state rectifiers; switching circuits; 100 nA; 1200 V; 50 A; P+iN diode; Schottky rectifier; Trench Oxide PiN Schottky diode; forward voltage drop; high aspect ratio P+ regions; high voltage rectifier; punch-through wafers; reverse leakage current; stored charge; switching characteristics; trench oxide structure; Area measurement; Insulated gate bipolar transistors; Leakage current; Low voltage; P-i-n diodes; PIN photodiodes; Rectifiers; Schottky barriers; Schottky diodes; Springs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
Conference_Location :
Phoenix, AZ
ISSN :
0197-2618
Print_ISBN :
0-7803-5589-X
Type :
conf
DOI :
10.1109/IAS.1999.799980
Filename :
799980
Link To Document :
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