Title :
Embedded & Graphics DRAMs
Author :
Sato, Katsuyuki ; Choi, Joo Sun
Author_Institution :
TSMC, Hsinchu, Taiwan
Keywords :
Bandwidth; Clocks; Costs; Error correction codes; Graphics; Logic; Random access memory; Research and development; Sun; Testing;
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
Electronic_ISBN :
978-1-4244-2011-7
DOI :
10.1109/ISSCC.2008.4523160
