Title :
ICFAX, an integrated circuit failure analysis expert system
Author :
Henderson, Christopher L. ; Soden, Jerry M.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Abstract :
An expert system to aid in the analysis of failed integrated circuits has been developed. The integrated circuit failure analysis expert system (ICFAX) captures a substantial portion of the procedural knowledge necessary to successfully analyze CMOS integrated circuit failures. ICFAX is designed to apply generically to all types of CMOS ICs. ICFAX also contains general information on how to analyze components as well as product specific information, including schematics, layout plots, product specifications, and fabrication data. The expert system centralizes textual and graphical knowledge about failure analysis, increasing the analyst´s productivity and ability to determine the failure.<>
Keywords :
CMOS integrated circuits; circuit analysis computing; circuit reliability; expert systems; failure analysis; knowledge acquisition; CMOS integrated circuit; ICFAX; expert system; failed integrated circuits; graphical knowledge; integrated circuit failure analysis; layout plots; procedural knowledge; product specific information; textual knowledge; Artificial intelligence; Diagnostic expert systems; Expert systems; Fabrication; Failure analysis; Information analysis; Integrated circuit technology; Laboratories; Medical expert systems; Microelectronics;
Conference_Titel :
Reliability Physics Symposium, 1991, 29th Annual Proceedings., International
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-87942-680-2
DOI :
10.1109/RELPHY.1991.146003
