ICFAX, an integrated circuit failure analysis expert system

Author

Henderson, Christopher L. ; Soden, Jerry M.

Author_Institution

Sandia Nat. Lab., Albuquerque, NM, USA

fYear

1991

fDate

9-11 April 1991

Firstpage

142

Lastpage

151

Abstract

An expert system to aid in the analysis of failed integrated circuits has been developed. The integrated circuit failure analysis expert system (ICFAX) captures a substantial portion of the procedural knowledge necessary to successfully analyze CMOS integrated circuit failures. ICFAX is designed to apply generically to all types of CMOS ICs. ICFAX also contains general information on how to analyze components as well as product specific information, including schematics, layout plots, product specifications, and fabrication data. The expert system centralizes textual and graphical knowledge about failure analysis, increasing the analyst´s productivity and ability to determine the failure.<>

Keywords

CMOS integrated circuits; circuit analysis computing; circuit reliability; expert systems; failure analysis; knowledge acquisition; CMOS integrated circuit; ICFAX; expert system; failed integrated circuits; graphical knowledge; integrated circuit failure analysis; layout plots; procedural knowledge; product specific information; textual knowledge; Artificial intelligence; Diagnostic expert systems; Expert systems; Fabrication; Failure analysis; Information analysis; Integrated circuit technology; Laboratories; Medical expert systems; Microelectronics;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1991, 29th Annual Proceedings., International

Conference_Location

Las Vegas, NV, USA

Print_ISBN

0-87942-680-2

Type

conf

DOI

10.1109/RELPHY.1991.146003

Filename

146003