DocumentCode :
3464296
Title :
Work function tunability by incorporating lanthanum and aluminum into refractory metal nitrides and a feasible integration process
Author :
Wang, Xin Peng ; Li, Ming-Fu ; Yu, H.Y. ; Ren, C. ; Loh, W.-Y. ; Zhu, C.X. ; Chin, Albert ; Trigg, A.D. ; Yeo, Yee-Chi A. ; Biesemans, S. ; Lo, G.Q. ; Kwong, D.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., National Univ. of Singapore
fYear :
2006
fDate :
Oct. 2006
Firstpage :
424
Lastpage :
426
Abstract :
In this work, lanthanum-incorporated refractory metal nitride is investigated as an n-type metal gate electrode with tunable work function. By adding La into HfN metal gate deposited on SiO2 gate dielectric, its gate work function can be tuned from 4.6 eV to 3.9 eV continuously by changing La composition. The authors also report the effective work function of TaN can be tuned to p-type with the incorporation of Al based on our findings, we propose a feasible integration process for dual metal gate CMOS technology
Keywords :
CMOS integrated circuits; aluminium; dielectric materials; electrodes; hafnium compounds; lanthanum; refractories; silicon compounds; tantalum compounds; work function; 3.9 to 4.6 eV; Al; CMOS technology; HfN; La; SiO2; TaN; gate work function; metal gate electrode; Aluminum; Annealing; CMOS process; CMOS technology; Capacitance-voltage characteristics; Electrodes; High K dielectric materials; High-K gate dielectrics; Lanthanum; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306268
Filename :
4098125
Link To Document :
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