• DocumentCode
    3464361
  • Title

    Advances in atomic level deposition technologies

  • Author

    Seidel, Tom ; Dalton, Jeremie ; Karim, Zia ; Lindner, Johannes ; Daulesberg, Martin ; Zhang, Wei

  • Author_Institution
    AIXTRON - Genus, Inc., Sunnyvale, CA
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    436
  • Lastpage
    439
  • Abstract
    Atomic layer deposition (ALD) has emerged as an enabling thin film deposition technology for making semiconductor devices with design rules below 100nm, especially when conformal coatings on high aspect ratio devices are needed. However, ALD is limited in deposition rate. In response to this, recent advances include new capabilities using high productivity thermal ALD, plasma assisted ALD and pulsed CVD. These various technologies, referred to as "atomic level deposition". They all have the ability to deposit films with digital control, with granularity at the 0.1- 1nm levels, albeit with different conformality capabilities. Applications for the diverse technologies include: advanced gates, DRAM capacitors, non-volatile memories and interconnects, as well as data storage devices. This paper reviews advances of the various atomic level deposition approaches in the context of their actual and potential applications
  • Keywords
    atomic layer deposition; capacitors; integrated circuit interconnections; nanotechnology; random-access storage; semiconductor technology; DRAM capacitors; advanced gates; atomic level deposition; conformal coatings; conformality capabilities; data storage devices; device interconnects; digital control; diverse technologies; high aspect ratio devices; high productivity thermal ALD; nonvolatile memories; plasma assisted ALD; pulsed CVD; semiconductor devices; thin film deposition; Atomic layer deposition; Capacitors; Coatings; Digital control; Plasma applications; Plasma devices; Productivity; Random access memory; Semiconductor devices; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306294
  • Filename
    4098129