DocumentCode :
3464450
Title :
TESPAD: a testability specifications advisor for a structured test methodology
Author :
Weber, W. ; McNamer, M. ; Kanopoulos, N.
Author_Institution :
Data Commun. Technol., RTP, NC, USA
Volume :
2
fYear :
1996
fDate :
13-16 Oct 1996
Firstpage :
1068
Abstract :
The increased complexity of, and heightened reliance on, modern electronic systems has raised the importance of the testing of these systems to new levels. The key to a successful testing strategy is the use of a structured testability methodology throughout the design life cycle. The automation of such a methodology is achieved through TESPAD, a PC-based, Windows 3.1 tool. TESPAD assists in the incorporation of a structured methodology by defining and allocating, at early stages of (and throughout) the design life cycle, detailed testability measures, recommended DFT/BIT methods and structures, data formats and data delivery, and validation/verification procedures
Keywords :
automatic test software; design for testability; electronic engineering computing; electronic equipment testing; BIT methods; DFT methods; PC-based Windows 3.1 tool; TESPAD; data delivery; data formats; structured test methodology; testability measures; testability specifications advisor; validation procedures; verification procedures; Circuit testing; Combinational circuits; Costs; Design methodology; Electronic equipment testing; Integrated circuit interconnections; Life testing; Logic testing; Sequential analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location :
Rodos
Print_ISBN :
0-7803-3650-X
Type :
conf
DOI :
10.1109/ICECS.1996.584605
Filename :
584605
Link To Document :
بازگشت