• DocumentCode
    3464450
  • Title

    TESPAD: a testability specifications advisor for a structured test methodology

  • Author

    Weber, W. ; McNamer, M. ; Kanopoulos, N.

  • Author_Institution
    Data Commun. Technol., RTP, NC, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    13-16 Oct 1996
  • Firstpage
    1068
  • Abstract
    The increased complexity of, and heightened reliance on, modern electronic systems has raised the importance of the testing of these systems to new levels. The key to a successful testing strategy is the use of a structured testability methodology throughout the design life cycle. The automation of such a methodology is achieved through TESPAD, a PC-based, Windows 3.1 tool. TESPAD assists in the incorporation of a structured methodology by defining and allocating, at early stages of (and throughout) the design life cycle, detailed testability measures, recommended DFT/BIT methods and structures, data formats and data delivery, and validation/verification procedures
  • Keywords
    automatic test software; design for testability; electronic engineering computing; electronic equipment testing; BIT methods; DFT methods; PC-based Windows 3.1 tool; TESPAD; data delivery; data formats; structured test methodology; testability measures; testability specifications advisor; validation procedures; verification procedures; Circuit testing; Combinational circuits; Costs; Design methodology; Electronic equipment testing; Integrated circuit interconnections; Life testing; Logic testing; Sequential analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
  • Conference_Location
    Rodos
  • Print_ISBN
    0-7803-3650-X
  • Type

    conf

  • DOI
    10.1109/ICECS.1996.584605
  • Filename
    584605