DocumentCode
3464450
Title
TESPAD: a testability specifications advisor for a structured test methodology
Author
Weber, W. ; McNamer, M. ; Kanopoulos, N.
Author_Institution
Data Commun. Technol., RTP, NC, USA
Volume
2
fYear
1996
fDate
13-16 Oct 1996
Firstpage
1068
Abstract
The increased complexity of, and heightened reliance on, modern electronic systems has raised the importance of the testing of these systems to new levels. The key to a successful testing strategy is the use of a structured testability methodology throughout the design life cycle. The automation of such a methodology is achieved through TESPAD, a PC-based, Windows 3.1 tool. TESPAD assists in the incorporation of a structured methodology by defining and allocating, at early stages of (and throughout) the design life cycle, detailed testability measures, recommended DFT/BIT methods and structures, data formats and data delivery, and validation/verification procedures
Keywords
automatic test software; design for testability; electronic engineering computing; electronic equipment testing; BIT methods; DFT methods; PC-based Windows 3.1 tool; TESPAD; data delivery; data formats; structured test methodology; testability measures; testability specifications advisor; validation procedures; verification procedures; Circuit testing; Combinational circuits; Costs; Design methodology; Electronic equipment testing; Integrated circuit interconnections; Life testing; Logic testing; Sequential analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location
Rodos
Print_ISBN
0-7803-3650-X
Type
conf
DOI
10.1109/ICECS.1996.584605
Filename
584605
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