Title :
Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions
Author_Institution :
Alcan Int. Ltd., Kingston, Ont., Canada
Abstract :
Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<>
Keywords :
aluminium; brass; electrical contacts; Al-Al contacts; Al-CuZn contacts; O/sub 2/ atmosphere; carbonaceous material; contaminant-induced degeneration; electrical instabilities surface contaminants; growth of intermetallic compounds; junction recovery; long exposure; stationary contacts; stationary point junctions; ultrahigh vacuum; Aluminum; Artificial intelligence; Contacts; Creep; Degradation; Intermetallic; Oxidation; Surface cleaning; Surface contamination; Temperature;
Conference_Titel :
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/HOLM.1988.16111