• DocumentCode
    3464566
  • Title

    Study on the lapping slurry for ULSI silicon substrate preparation

  • Author

    Zhou, Jian-Wei ; Niu, Xin-huan ; Shi, Qiao-shuo ; Liu, Yu-ling

  • Author_Institution
    Inst. of Microelectron., Hebei Univ. of Technol., Tianjin
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    487
  • Lastpage
    488
  • Abstract
    Lapping is one of the basic procedures in silicon device substrate preparation. There exist excess stress, serious surface scratch, damage and pollution of ion in the procedure of lapping process, so it is necessary to improve the mechanism of lapping through changing the single mechanical action to equilibrium chemical and mechanical action. Under the condition of chemical mechanical action, small damage and low stress on silicon wafers can be gained, which can decrease the breakage and stress accumulation. Then the product quality and machining efficiency can be improved. In this study, the lapping slurry mechanism of action was introduced, and the operation significance and development status were analyzed. Through improving the original lapping slurry, the dispersibility and floatability of lapping slurry was improved. The component, action and mechanism of lapping slurry were also introduced
  • Keywords
    ULSI; chemical mechanical polishing; lapping (machining); planarisation; silicon; slurries; substrates; ULSI; chemical mechanical action; imporved dispersibility; improved floatability; improved machining efficiency; improved product quality; lapping process; lapping slurry mechanism; substrate preparation; Abrasives; Chemical analysis; Lapping; Rough surfaces; Silicon; Slurries; Solids; Stress; Surface roughness; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306309
  • Filename
    4098144