Title : 
A new decoupling technique for suppressing radiated emissions arising from power bus resonance of multilayer PCBs
         
        
            Author : 
Sasaki, Hideki ; Harada, Takashi ; Kuriyama, Toshihide
         
        
            Author_Institution : 
Device Anal. Technol. Labs., NEC Corp., Kawasaki, Japan
         
        
        
        
        
        
            Abstract : 
This paper presents a new decoupling technique for suppressing radiated emissions that arise from power bus resonance in multilayer printed circuit boards (PCBs). The technique utilizes a decoupling circuit composed of two decoupling capacitors and a power trace. The capacitors are placed at the power pin of an active device and at a common power bus in the board. They are connected to the power trace. The characteristic impedance of the trace is much higher than the impedance of the capacitor. The length of the trace between the capacitors is slightly shorter than 1/4 the wavelength of 1 GHz. Our tests of the four-layer PCB confirm suppression of the resonance, reduction of the amplitude of the power bus current and voltage, and suppression of radiation
         
        
            Keywords : 
capacitors; circuit resonance; electric impedance; electromagnetic compatibility; electromagnetic interference; printed circuit testing; printed circuits; active device; common power bus; decoupling capacitors; decoupling circuit; decoupling technique; impedance; multilayer PCB; multilayer printed circuit boards; power bus current amplitude reduction; power bus resonance; power bus voltage amplitude reduction; power pin; power trace; radiated emissions suppression; resonance suppression; Distributed parameter circuits; Impedance; Nonhomogeneous media; Oscillators; Power capacitors; Power distribution; Power transmission lines; Printed circuits; Resonance; Transmission line theory;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility, 1999 International Symposium on
         
        
            Conference_Location : 
Tokyo
         
        
            Print_ISBN : 
4-9980748-4-9
         
        
        
            DOI : 
10.1109/ELMAGC.1999.801251