• DocumentCode
    346465
  • Title

    EFT/B immunity test conditions of telecommunication equipment using ISDN basic interfaces

  • Author

    Kanno, Shin ; Miyashita, Seiichi ; Hiroshima, Yoshiharu

  • Author_Institution
    NTT Multimedia Networks Labs., Tokyo, Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    75
  • Lastpage
    78
  • Abstract
    Test conditions are significant factors in testing such as the sweep rate in conducted continuous wave immunity testing, or the duration of impress bursts in EFT/B immunity testing. The effects of various impressed waveforms were measured. Determination of waveform generating parameters for basic ISDN telecommunications equipment is discussed. Communication method of basic ISDN telecommunication equipment is investigated as to physical, data link, and network layers. The most suitable waveform for a basic ISDN interface is discussed
  • Keywords
    ISDN; electromagnetic interference; protocols; telecommunication equipment testing; EFT/B immunity test conditions; ISDN basic interfaces; ISDN telecommunications equipment; conducted continuous wave immunity testing; data link layer; impress bursts; network layer; physical layer; sweep rate; telecommunication equipment; test conditions; waveform generating parameters; Degradation; IEC standards; IP networks; ISDN; Immunity testing; Protocols; Pulse measurements; Throughput; Time measurement; Web and internet services;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1999 International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    4-9980748-4-9
  • Type

    conf

  • DOI
    10.1109/ELMAGC.1999.801266
  • Filename
    801266