DocumentCode :
3464840
Title :
Impact of 1/f noise of DVM on Josephson voltage standard comparison
Author :
Tang, Y. ; Solve, S. ; Witt, T.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
175
Lastpage :
176
Abstract :
In most key and regional comparisons of Josephson voltage standards (JVS) the Type A uncertainty is assumed to be the standard deviation of the mean of the measurand calculated as if repeated measurement values were uncorrelated. In a recent JVS key comparison (BIPM.EM-K10.b) between the Bureau International des Poids et Mesures (BIPM) and the National Institute of Standards and Technology (NIST), an alternative protocol was used by the NIST to enable automatic data acquisition over 14 hours. After correcting the data for residual dependence on barometric pressure, the 218 individual results are sufficient to numerically characterize autocorrelation effects. The analysis shows that the Type A uncertainty is limited by 1/ f noise in the DVM used as the null detector.
Keywords :
data acquisition; measurement standards; measurement uncertainty; voltage measurement; 1/f noise; BIPM; Bureau International des Poids et Mesures; DVM; JVS; Josephson voltage standards; NIST; National Institute of Standards and Technology; Type A uncertainty; autocorrelation effects; automatic data acquisition; barometric pressure; mean standard deviation calculation; null detector; Atmospheric measurements; Data acquisition; Helium; Measurement standards; NIST; Pressure measurement; Protocols; Time measurement; Valves; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5543589
Filename :
5543589
Link To Document :
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