DocumentCode
3464840
Title
Impact of 1/f noise of DVM on Josephson voltage standard comparison
Author
Tang, Y. ; Solve, S. ; Witt, T.J.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
175
Lastpage
176
Abstract
In most key and regional comparisons of Josephson voltage standards (JVS) the Type A uncertainty is assumed to be the standard deviation of the mean of the measurand calculated as if repeated measurement values were uncorrelated. In a recent JVS key comparison (BIPM.EM-K10.b) between the Bureau International des Poids et Mesures (BIPM) and the National Institute of Standards and Technology (NIST), an alternative protocol was used by the NIST to enable automatic data acquisition over 14 hours. After correcting the data for residual dependence on barometric pressure, the 218 individual results are sufficient to numerically characterize autocorrelation effects. The analysis shows that the Type A uncertainty is limited by 1/ f noise in the DVM used as the null detector.
Keywords
data acquisition; measurement standards; measurement uncertainty; voltage measurement; 1/f noise; BIPM; Bureau International des Poids et Mesures; DVM; JVS; Josephson voltage standards; NIST; National Institute of Standards and Technology; Type A uncertainty; autocorrelation effects; automatic data acquisition; barometric pressure; mean standard deviation calculation; null detector; Atmospheric measurements; Data acquisition; Helium; Measurement standards; NIST; Pressure measurement; Protocols; Time measurement; Valves; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5543589
Filename
5543589
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