• DocumentCode
    3464840
  • Title

    Impact of 1/f noise of DVM on Josephson voltage standard comparison

  • Author

    Tang, Y. ; Solve, S. ; Witt, T.J.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    175
  • Lastpage
    176
  • Abstract
    In most key and regional comparisons of Josephson voltage standards (JVS) the Type A uncertainty is assumed to be the standard deviation of the mean of the measurand calculated as if repeated measurement values were uncorrelated. In a recent JVS key comparison (BIPM.EM-K10.b) between the Bureau International des Poids et Mesures (BIPM) and the National Institute of Standards and Technology (NIST), an alternative protocol was used by the NIST to enable automatic data acquisition over 14 hours. After correcting the data for residual dependence on barometric pressure, the 218 individual results are sufficient to numerically characterize autocorrelation effects. The analysis shows that the Type A uncertainty is limited by 1/ f noise in the DVM used as the null detector.
  • Keywords
    data acquisition; measurement standards; measurement uncertainty; voltage measurement; 1/f noise; BIPM; Bureau International des Poids et Mesures; DVM; JVS; Josephson voltage standards; NIST; National Institute of Standards and Technology; Type A uncertainty; autocorrelation effects; automatic data acquisition; barometric pressure; mean standard deviation calculation; null detector; Atmospheric measurements; Data acquisition; Helium; Measurement standards; NIST; Pressure measurement; Protocols; Time measurement; Valves; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5543589
  • Filename
    5543589