Title :
Application of trace-norm and low-rank matrix decomposition for computational anatomy
Author :
Batmanghelich, Nematollah ; Gooya, Ali ; Kanterakis, Stathis ; Taskar, Ben ; Davatzikos, Christos
Author_Institution :
Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
Abstract :
We propose a generative model to distinguish normal anatomical variations from abnormal deformations given a group of images with normal and abnormal subjects. We assume that abnormal subjects share common factors which characterize the abnormality. These factors are hard to discover due to large variance of normal anatomical differences. Assuming that the deformation fields are parametrized by their stationary velocity fields, these factors constitute a low-rank subspace (abnormal space) that is corrupted by high variance normal anatomical differences. We assume that these normal anatomical variations are not correlated. We form an optimization problem and propose an efficient iterative algorithm to recover the low-rank subspace. The algorithm iterates between image registration and the decomposition steps and hence can be seen as a group-wise registration algorithm. We apply our method on synthetic and real data and discover abnormality of the population that cannot be recovered by some of the well-known matrix decompositions (e.g. Singular Value Decomposition).
Keywords :
image registration; iterative methods; medical image processing; optimisation; singular value decomposition; abnormal deformation; computational anatomy; generative model; group wise registration algorithm; image registration; iterative algorithm; low rank matrix decomposition; low rank subspace; matrix decompositions; normal anatomical difference; normal anatomical variation; optimization problem; singular value decomposition; trace norm application; Anatomy; Application software; Biomedical computing; Biomedical imaging; Brain; Deformable models; Image analysis; Iterative algorithms; Matrix decomposition; Singular value decomposition;
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-7029-7
DOI :
10.1109/CVPRW.2010.5543596