• DocumentCode
    3465028
  • Title

    Evaluation of the transfer errors of single junction thermal voltage converter (SJTVC) via electrical simulation

  • Author

    Halawa, Mamdouh

  • Author_Institution
    Nat. Inst. for Stand. (NIS), Giza, Egypt
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    The physical structure of the SJTVC can be represented via simulation using an equivalent RLC circuit to evaluate the error sources when used as a standard for AC measurements. This paper describes the applied technique on 0.6 V SJTVC to estimate the errors at 100 kHz and 1 MHz. The LTspice/SwCAD III simulator was used to analyze the effect of the physical structure of SJTVC in an effort to better understand the origin of errors at the two frequencies. The SJTVC was firstly calibrated in National Institute for Standard and Technology (NIST), to confirm the simulation model at 100 kHz. The model then used to estimate the transfer errors of the SJTVC at 1 MHz. Some of the dominated error sources such as the changes of the real part of the heater impedance and the effect of thermocouple grounding are estimated at the two frequencies.
  • Keywords
    RLC circuits; calibration; digital simulation; electronic engineering computing; equivalent circuits; error analysis; thermocouples; AC measurement standards; LTspice III simulator; NIST; National Institute for Standard and Technology; SJTVC calibration; SJTVC physical structure; SwCAD III simulator; electrical simulation; equivalent RLC circuit; frequency 1 MHz; frequency 100 kHz; heater impedance; single junction thermal voltage converter; thermocouple grounding; transfer errors evaluation; voltage 0.6 V; Circuit simulation; Code standards; Current measurement; Frequency estimation; Impedance; Laboratories; Measurement standards; NIST; Tellurium; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2010 Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4244-6795-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2010.5543598
  • Filename
    5543598