DocumentCode :
3465121
Title :
Comparative surface investigations at spherical Si surfaces using optical and X-ray techniques
Author :
Busch, I. ; Fuchs, P. ; Krumrey, M. ; Kuetgens, U.
Author_Institution :
Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
494
Lastpage :
495
Abstract :
Currently options for a new definition of the kilogram on the basis of invariants of nature are under investigations. One of the most promising approaches uses the mass of 12C. Within the framework of the Avogadro project the scaling factor between atomic mass units and macroscopic mass, the Avogadro constant NA, will be measured with a relative standard uncertainty 2·10-8, to enable this type of realization.
Keywords :
X-ray optics; atom optics; elemental semiconductors; optical constants; silicon; Avogadro constant; Avogadro project; Si; X-ray techniques; atomic mass units; comparative surface investigations; macroscopic mass; optical techniques; scaling factor; spherical surfaces; Atomic measurements; Calibration; Chemical elements; Contamination; Instruments; Pollution measurement; Reflectometry; Surface topography; Thickness measurement; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
Type :
conf
DOI :
10.1109/CPEM.2010.5543604
Filename :
5543604
Link To Document :
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