• DocumentCode
    3465218
  • Title

    A hierarchical approach to facial aging

  • Author

    Sethuram, Amrutha ; Ricanek, Karl ; Patterson, Eric

  • Author_Institution
    Comput. Sci. Dept., UNCW, Wilmington, NC, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    100
  • Lastpage
    107
  • Abstract
    Active Appearance Models (AAMs) have been used as a promising tool in the field of synthetic age progression. However, they are yet to be demonstrated on a large human population with wide variation. This paper presents a novel AAM-based hierarchical approach to facial aging. This work is motivated from studies in medical and anthropological literature on classification of human faces based on gender, ethnic and age groups. The proposed hierarchical model approach is a ethnicity and gender specific aging paradigm. Specifically, the Caucasian (European descent) and African American ethnic groups are considered. This work will further show that using individual hierarchical models generate better age-progressed synthetic images when compared to a general model approach. The results are evaluated by visual perception of the intended age group and preservation of identity. Also, a quantitative evaluation was performed using FaceVACS, a commercial face recognition system, as a surrogate measure. Higher match scores for synthetic images generated by hierarchical models when compared to those generated by a general model suggests the efficiency of the proposed hierarchical model approach.
  • Keywords
    face recognition; visual perception; AAM-based hierarchical approach; African American ethnic groups; Caucasian; FaceVACS; active appearance models; ethnicity; face recognition system; facial aging; gender specific aging paradigm; synthetic age progression; visual perception; Active appearance model; Aging; Biomedical imaging; Computer science; Face recognition; Humans; Performance evaluation; Shape; Skin; Visual perception;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops (CVPRW), 2010 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-7029-7
  • Type

    conf

  • DOI
    10.1109/CVPRW.2010.5543611
  • Filename
    5543611