Title :
A Charge-Injection-Based Active-Decoupling Technique for Inductive-Supply-Noise Suppression
Author :
Pant, Sanjay ; Blaauw, David
Author_Institution :
Michigan Univ., Ann Arbor, MI
Abstract :
We demonstrate an active circuit to detect and suppress excessive supply-voltage undershoots and overshoots caused by large current transients or by excitation of supply resonance. A nominal-voltage active supply, VDDA, is used to inject extra charge into the power grid during excessive undershoots. The use of a nominal-voltage VDDA eliminates the need for any high-voltage supplies and enables use of decaps and transistors with nominal oxide thickness. Furthermore, this method has the advantage that the active decap bank, Calpha, behaves as a passive decap when the supply voltage is within safety margins.
Keywords :
active networks; active noise control; charge injection; voltage control; active circuit; active decap bank; active decoupling; charge injection; inductive supply noise suppression; nominal voltage active supply; supply resonance; supply voltage overshoots; supply voltage undershoots; Active circuits; Calibration; Circuit noise; Circuit testing; Clocks; Current measurement; Detectors; Noise figure; Noise measurement; Variable structure systems;
Conference_Titel :
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2010-0
Electronic_ISBN :
978-1-4244-2011-7
DOI :
10.1109/ISSCC.2008.4523234