Title :
Detectors for the X-ray testing systems
Author :
Ayzenshtat, G.I. ; Vilisova, M.D. ; Lelekov, M.A. ; Ivashchenko, A.I. ; Mokeev, D.Yu. ; Porokhovnichenko, L.P. ; Tolbanov, O.P. ; Shapoval, L.G.
Author_Institution :
Sci. & Production State Enterprise "Semicond. Devices Res. Inst.", Tomsk, Russia
Abstract :
The gallium arsenide detectors working in photovaultarical mode on epitaxial films compensated by chromium are developed. It is shown that in such detectors it is possible to essentially increase the efficiency of charge collection at inclined position of the detector relatively X-rays. The image with resolution 5 lp/mm is received by created coordinate detectors.
Keywords :
X-ray detection; semiconductor counters; semiconductor epitaxial layers; X-ray detector; X-ray testing system; chromium; epitaxial films; gallium arsenide detectors; image resolution; photovaultarical mode; Chromium; Digital systems; Gallium arsenide; Gamma ray detection; Gamma ray detectors; Silicon; System testing; X-ray detection; X-ray detectors; X-ray imaging; GaAs-detector; X-Ray detector;
Conference_Titel :
Control and Communications, 2005. SIBCON '05. IEEE International Siberian Conference on
Print_ISBN :
0-7803-9219-1
DOI :
10.1109/SIBCON.2005.1611196
