• DocumentCode
    3465721
  • Title

    A nodal analysis model for out-of-plane beamshaped electrothermal microactuators

  • Author

    Li, Rengang ; Huang, Qing-An ; Li, Weihua

  • Author_Institution
    Key Lab. of MEMS of Minist. of Educ., Southeast Univ., Nanjing
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    682
  • Lastpage
    684
  • Abstract
    This paper originally introduces a nodal analysis model for the out-of-plane beam-shaped electrothermal microactuator, which could simulate the temperature distribution along the actuator and the nodal displacement of the actuator. The beam is extracted as the essential element from this kind of actuators. With the temperature correlation along the beam taken into account, the computational complexity is significantly reduced to build the coupled electrothermal model of the beam. The nodal model of the beam with 12 degrees of freedom is utilized to represent the out-of-plane electrothermal microactuator which takes the effect of the change of axial length and large axial stress into account. The temperature dependent thermal conductivity of the beam and the air, heat convection coefficient of the beam surface, and the electrical resistivity are also calculated in the model of the beam. Simultaneously, the change of the gap between the beam and the substrate while actuating which is related closely to the heat transfered from the beam to the substrate, is included in the model. This nodal analysis model of the beam is verified by the published experiment results of the out-of-plane electrothermal microactuator fabricated at MUMPs
  • Keywords
    MUMPS; computational complexity; electrical resistivity; microactuators; temperature distribution; thermal conductivity; MUMP; beamshaped microactuators; computational complexity; coupled electrothermal model; electrical resistivity; electrothermal microactuators; nodal analysis model; out-of-plane microactuators; temperature distribution; thermal conductivity; Actuators; Analytical models; Computational complexity; Computational modeling; Electrothermal effects; Microactuators; Optical coupling; Temperature distribution; Thermal conductivity; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306436
  • Filename
    4098206