DocumentCode
3465786
Title
An 800MHz -122dBc/Hz-at-200kHz Clock Multiplier based on a Combination of PLL and Recirculating DLL
Author
Gierkink, Sander
Author_Institution
Conexant Syst., Red Bank, NJ
fYear
2008
fDate
3-7 Feb. 2008
Firstpage
454
Lastpage
627
Abstract
DLL clock multipliers outperform their PLL counterparts in terms of phase noise because they have significantly less jitter accumulation [R. Farjad-Rad et al., 2002; P.C. Maulik and D.A. Mercer, 2007; S. Ye and I. Galton, 2004]. Figure 25.2.1 shows the basic PLL and recirculating DLL. In the latter, the oscillator loop is periodically opened to let in a "clean" reference edge. It avoids the pattern jitter due to delay-stage mismatch as seen normally in an edge-combining DLL. The remaining pattern jitter is due to static phase offset of the phase detector (PD)/charge pump (CP). This offset transfers to a phase discontinuity between the two edges that are substituted for one another [P.C. Maulik and D.A. Mercer, 2007]. As a result the clock spectrum shows severe reference spurs, as high as -37dBc in [R. Farjad-Rad et al., 2002]. This is especially undesirable in applications like ADCs where clock spurs convolute with the spectrum of the input signal. By contrast, in a PLL, static phase offset introduces no direct phase discontinuity in the output clock. Nevertheless, it still causes a periodic ripple across the loop filter that modulates the oscillator. By tightening the filter, the ripple is filtered more, lowering the reference spur. However, this reduces loop bandwidth leading to less suppression of oscillator phase noise.
Keywords
clocks; frequency multipliers; jitter; multiplying circuits; phase locked loops; phase locked oscillators; PLL; charge pump; clock multiplier; clock spectrum; delay-stage mismatch; frequency 200 kHz; frequency 800 MHz; loop filter; oscillator loop; oscillator phase noise suppression; pattern jitter; phase detector; phase discontinuity; phase locked loops; phase noise because; static phase offset; Charge pumps; Clocks; Delay; Detectors; Filters; Jitter; Oscillators; Phase detection; Phase locked loops; Phase noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4244-2010-0
Electronic_ISBN
978-1-4244-2011-7
Type
conf
DOI
10.1109/ISSCC.2008.4523253
Filename
4523253
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