• DocumentCode
    3465968
  • Title

    Models and measurements of Hg/sub 1-x/Cd/sub x/Te heterojunction transistors

  • Author

    Jack, M. ; Chapman, G. ; Kalisher, M. ; Kosai, K. ; Myrosznyk, J. ; Radford, W. ; Ray, M. ; Wu, O.K.

  • Author_Institution
    Santa Barbara Research Center
  • fYear
    1990
  • fDate
    9-12 Dec. 1990
  • Firstpage
    689
  • Lastpage
    692
  • Abstract
    Heterojunction Hg1.,CdxTe (HCT) diodes fabricated by liquid phase epitaxy (LPE) are a key to ultrahigh performance Infrared Focal Planes [ll. The authors present for the first time the results of measurements of both heterojunction FETs and bipolar transistors fabricated using LPE. These offer benefits for low noise amplification. Breakthroughs in 11-VI Molecular Beam Epitaxy (MBE) now enable excellent control of layer width and doping. Simulations utilizing a program developed for IIVI heterojunction devices show that MBE-based HCT he terojun c ti on bi p ol ar transistors (HBTs) can be competitive with state-of-the-art silicon and 111-V HBTs at low temperatures.
  • Keywords
    Bipolar transistors; Doping; Epitaxial growth; Fabrication; Heterojunctions; JFETs; Mercury (metals); Molecular beam epitaxial growth; Thickness control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1990.948898
  • Filename
    948898