DocumentCode :
3465968
Title :
Models and measurements of Hg/sub 1-x/Cd/sub x/Te heterojunction transistors
Author :
Jack, M. ; Chapman, G. ; Kalisher, M. ; Kosai, K. ; Myrosznyk, J. ; Radford, W. ; Ray, M. ; Wu, O.K.
Author_Institution :
Santa Barbara Research Center
fYear :
1990
fDate :
9-12 Dec. 1990
Firstpage :
689
Lastpage :
692
Abstract :
Heterojunction Hg1.,CdxTe (HCT) diodes fabricated by liquid phase epitaxy (LPE) are a key to ultrahigh performance Infrared Focal Planes [ll. The authors present for the first time the results of measurements of both heterojunction FETs and bipolar transistors fabricated using LPE. These offer benefits for low noise amplification. Breakthroughs in 11-VI Molecular Beam Epitaxy (MBE) now enable excellent control of layer width and doping. Simulations utilizing a program developed for IIVI heterojunction devices show that MBE-based HCT he terojun c ti on bi p ol ar transistors (HBTs) can be competitive with state-of-the-art silicon and 111-V HBTs at low temperatures.
Keywords :
Bipolar transistors; Doping; Epitaxial growth; Fabrication; Heterojunctions; JFETs; Mercury (metals); Molecular beam epitaxial growth; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1990.948898
Filename :
948898
Link To Document :
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