DocumentCode
3465968
Title
Models and measurements of Hg/sub 1-x/Cd/sub x/Te heterojunction transistors
Author
Jack, M. ; Chapman, G. ; Kalisher, M. ; Kosai, K. ; Myrosznyk, J. ; Radford, W. ; Ray, M. ; Wu, O.K.
Author_Institution
Santa Barbara Research Center
fYear
1990
fDate
9-12 Dec. 1990
Firstpage
689
Lastpage
692
Abstract
Heterojunction Hg1.,CdxTe (HCT) diodes fabricated by liquid phase epitaxy (LPE) are a key to ultrahigh performance Infrared Focal Planes [ll. The authors present for the first time the results of measurements of both heterojunction FETs and bipolar transistors fabricated using LPE. These offer benefits for low noise amplification. Breakthroughs in 11-VI Molecular Beam Epitaxy (MBE) now enable excellent control of layer width and doping. Simulations utilizing a program developed for IIVI heterojunction devices show that MBE-based HCT he terojun c ti on bi p ol ar transistors (HBTs) can be competitive with state-of-the-art silicon and 111-V HBTs at low temperatures.
Keywords
Bipolar transistors; Doping; Epitaxial growth; Fabrication; Heterojunctions; JFETs; Mercury (metals); Molecular beam epitaxial growth; Thickness control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1990.948898
Filename
948898
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