Title :
Metrology of microstructured waveguides for spintronic applications
Author :
Lim, Sang-Hyun ; Wallis, T. Mitch ; Imtiaz, Atif ; Gu, Dazhen ; Krivosik, Pavol ; Kabos, Pavel
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Patterned permalloy films embedded in a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures were investigated. Anisotropic magneto-resistance (AMR) effect was utilized as the detection mechanism to study the dynamics of such device structures. The introduced approach is suitable for investigation of magnetization dynamics in small magnetic devices and other candidate systems for spintronic applications.
Keywords :
Permalloy; coplanar waveguides; electric resistance measurement; enhanced magnetoresistance; magnetic thin films; magnetic variables measurement; magnetisation; magnetoelectronics; magnetoresistive devices; microfabrication; anisotropic magnetoresistance effect; coplanar waveguide; magnetic device; magnetization dynamics; microstructured waveguide metrology; patterned permalloy film; spintronic application; Anisotropic magnetoresistance; Coplanar waveguides; Magnetic anisotropy; Magnetic devices; Magnetic films; Magnetic resonance; Magnetization; Magnetoelectronics; Metrology; Perpendicular magnetic anisotropy;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5543664
