DocumentCode :
3466083
Title :
Design and reliability considerations in implants
Author :
Schaldach, M.
Author_Institution :
Zentralinstitut fuer Biomed. Tech., Univ. of Erlangen, West Germany
fYear :
1988
fDate :
4-7 Nov. 1988
Firstpage :
1235
Abstract :
The author discusses a variety of failure mechanisms and their causes and delineates design guidelines that minimize their occurrence. He discusses passive components utilized in implantable hybrids, namely capacitors, resistors, and inductors. He examines the typical semiconductor characteristics and operating conditions required for implantable products, and describes bipolar and CMOS integrated circuits. The design of a sophisticated pacemaker hybrid is presented. Quality control issues are considered.<>
Keywords :
biomedical electronics; prosthetics; CMOS integrated circuits; bipolar integrated circuits; capacitors; failure mechanisms; implant design; implantable hybrids; inductors; passive components; quality control; resistors; semiconductor characteristics; sophisticated pacemaker hybrid;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1988. Proceedings of the Annual International Conference of the IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0785-2
Type :
conf
DOI :
10.1109/IEMBS.1988.94891
Filename :
94891
Link To Document :
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