DocumentCode :
3466099
Title :
The research on high-voltage measurement
Author :
Yang, Chunting ; Cai, Weijian ; Yu, Jing
Author_Institution :
Sch. of Inf. & Electron. Eng., Zhejiang Univ. of Sci. & Technol., Hangzhou, China
Volume :
2
fYear :
2009
fDate :
5-6 Dec. 2009
Firstpage :
92
Lastpage :
95
Abstract :
Capacitor voltage transformers (CVT) gradually replace the electromagnetic voltage transformers (EVT) in high-voltage measurements in recent years. But transient process of CVTs is worse. Recently much research work has been focused on improving CVT. In this paper a novel CVT named capacitance-resistance voltage transformer (CRVT) is put forward. Its principle is analyzed, and transient response is investigated. The results show that transient response is improved greatly. Furthermore we analyze the effect of environmental factors on the measurement precision of CRVT. Stray capacitance and temperature are two important environmental factors. Theoretical mode of effects on measurement precision is counted, and some parameters are surveyed. The effects of the stray capacitance and environmental temperature on measurement precision are analyzed, and the quantitative relationships are described. The methods for improving measurement precision are provided. Both theoretical analysis and experimental results show that CRVTs are much better than CVTs.
Keywords :
capacitance; transformers; voltage measurement; capacitance-resistance voltage transformer; capacitor voltage transformers; electromagnetic voltage transformers; environmental temperature; high-voltage measurement; stray capacitance; Capacitance; Condition monitoring; Electromagnetic measurements; Environmental factors; Equivalent circuits; Mechanical variables measurement; Power engineering and energy; Power measurement; Temperature; Voltage transformers; capacitance-resistance; high-voltage measurement; measurement precision;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test and Measurement, 2009. ICTM '09. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4699-5
Type :
conf
DOI :
10.1109/ICTM.2009.5412996
Filename :
5412996
Link To Document :
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