A systems framework for transmitting information between design and test

Author

Rhyne, Richard T. ; Barton, David L. ; Bukata, Eric

fYear

2001

fDate

2001

Firstpage

54

Lastpage

62

Abstract

In spite of good intentions, and the work of many people over many years, test engineers and design engineers are still divided by a great chasm. Design information is still thrown "over the wall" to test, and information from test is seldom reflected back in design. The authors present a systems framework that allows models to be used as design rule specifications in the design process, used as test requirements in the test process, and modified by measurement data from the production floor

Keywords

application specific integrated circuits; automatic testing; design for testability; integrated circuit design; integrated circuit modelling; integrated circuit testing; production testing; Rosetta models; derating models; design process; design rule checkers; design rules specifications; production floor; systems framework; systems on chip design; test requirements; Design engineering; Equations; Frequency measurement; Heart; Process design; Production systems; Silicon; System testing; Time measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference

Conference_Location

Valley Forge, PA

ISSN

1080-7225

Print_ISBN

0-7803-7094-5

Type

conf

DOI

10.1109/AUTEST.2001.948919

Filename

948919