DocumentCode
3466177
Title
On the Use of Dynamic Binary Instrumentation to Perform Faults Injection in Transaction Level Models
Author
da Silva Farina, A. ; Prieto, S.S.
Author_Institution
Univ. Politec. de Madrid, Madrid, Spain
fYear
2009
fDate
June 30 2009-July 2 2009
Firstpage
237
Lastpage
244
Abstract
Transaction Level Modelling (TLM) has been widely accepted as systems modelling framework focused in system components communication. This approach allows efficient accurate estimation and rapid design space exploration. Besides of the functional simulation for validation of a hardware/software designs, there are additional reliability requirements that need advanced simulation techniques to analyze the system behaviour in the presence of faults. Several traditional VHDL fault injection mechanisms like mutants or saboteurs have been adapted to SystemC model descriptions. The main drawback of these approaches is the necessity of source code modification to carry out the fault injection campaigns. In this paper, we propose the use of Dynamic Binary Instrumentation (DBI) to perform fault injection in SystemC TLM models. DBI is a technique to intercept software routine calls allowing argument and return value corruption and data structures modification at runtime. This technique needs neither source code modifications nor recompilation of models in order to generate module mutants or in order to insert saboteurs in the signal communication path.
Keywords
fault diagnosis; hardware description languages; hardware-software codesign; reliability; transaction processing; SystemC TLM model; SystemC model description; VHDL fault injection; advanced simulation technique; data structures modification; design space exploration; dynamic binary instrumentation; fault injection campaign; faults injection; hardware-software design; reliability requirement; return value corruption; software routine; source code modification; system components communication; systems modelling framework; transaction level modelling; Analytical models; Genetic mutations; Hardware; Instruments; Modeling; Runtime; Software design; Software tools; System testing; Timing; Dynamic Binary Instrumentation; Fault Injection; Transaction Level; Virtual Table Hooking;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependability of Computer Systems, 2009. DepCos-RELCOMEX '09. Fourth International Conference on
Conference_Location
Brunow
Print_ISBN
978-0-7695-3674-3
Type
conf
DOI
10.1109/DepCoS-RELCOMEX.2009.30
Filename
5261012
Link To Document