DocumentCode :
3466258
Title :
Method for testing and characterization of analog-digital system
Author :
Zagursky, V.
fYear :
2001
fDate :
2001
Firstpage :
115
Lastpage :
120
Abstract :
The authors propose a method of testing of analog-digital systems (ADS). It is developed linear inertial heteroscedastic ADS model that takes account of nonlinear and inertial conversion effects. The validity of the model is verified by actual measurements of the dynamic responses of analog-digital converter (ADC)
Keywords :
analogue-digital conversion; design for testability; electron device noise; frequency response; mixed analogue-digital integrated circuits; ADC testing; FFT; analog-digital systems; dynamic response; linear inertial heteroscedastic ADS model; mixed signal systems; Analog-digital conversion; Differential equations; Digital systems; Frequency response; Linear approximation; Manufacturing; Nonlinear dynamical systems; Signal processing; Signal to noise ratio; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
ISSN :
1080-7225
Print_ISBN :
0-7803-7094-5
Type :
conf
DOI :
10.1109/AUTEST.2001.948925
Filename :
948925
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3466258
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