DocumentCode
3466288
Title
An oven for component thermal characterization
Author
Wong, Philip K. ; Schmalzel, John L.
Author_Institution
Div. of Eng., Texas Univ., San Antonio, TX, USA
fYear
1988
fDate
4-7 Nov. 1988
Abstract
A simple, low-cost oven suitable for characterization of small components over the commercial temperature range (0-70 degrees C) is described. The oven has been applied to the thermal characterization of light-emitting diodes used in an instrument design. The prototype oven system hardware includes a PC-instrument digital multimeter, an interface with power supplies, a heated plate, and a small refrigerator. Oven control, data acquisition, and data analysis are all performed using the software package ASYST.<>
Keywords
automatic test equipment; characteristics measurement; computerised control; data acquisition; data analysis; electric furnaces; electronic equipment testing; light emitting diodes; 0 to 70 degC; ASYST software package; PC-instrument digital multimeter; component thermal characterization; data acquisition; data analysis; heated plate; interface; light-emitting diodes; low-cost oven; small components characterisation; small refrigerator;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1988. Proceedings of the Annual International Conference of the IEEE
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-0785-2
Type
conf
DOI
10.1109/IEMBS.1988.94893
Filename
94893
Link To Document