DocumentCode :
3466318
Title :
Window rip-up for faster testing and fault tolerance in FPGAs
Author :
Kataria, Pankaj ; Taylor, Andrew M. ; Emmert, J.M.
Author_Institution :
Dept. of Electron. & Comput. Eng., North Carolina Univ., Charlotte, NC, USA
fYear :
2001
fDate :
2001
Firstpage :
149
Lastpage :
158
Abstract :
In this paper we present a window based rip-up strategy for incrementally routing signal nets on Field Programmable Gate Arrays (FPGAs). In our strategy we use a variable size window to reduce the problem size when incrementally routing fault tolerant (FT) FPGA circuits. Our methods are suitable for standard FPGA routers as well as specialized routers used to incrementally route circuits in Adaptive Computing Systems (ACSs). We demonstrate our technique on a FPGA based, on-line ACS that is implemented with the ORCA© FPGA available from Lucent Technologies. The effectiveness of the technique for system configuration generation and its associated impact is evaluated across four benchmark circuits programmed on the ORCA 2C FPGA. The results show up to 65.5% reduction in router CPU time and 63.8% reduction in configuration file size
Keywords :
built-in self test; fault tolerant computing; field programmable gate arrays; integrated circuit testing; logic testing; network routing; reconfigurable architectures; adaptive computing systems; benchmark circuits; configuration file size reduction; faster on-line testing; incrementally routing signal nets FPGA; interconnect fault tolerance; logic fault tolerance; reprogrammable hardware; router CPU time reduction; system configuration generation; variable size window; window based rip-up strategy; Adaptive systems; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Hardware; Programmable logic arrays; Routing; Satellite broadcasting; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON Proceedings, 2001. IEEE Systems Readiness Technology Conference
Conference_Location :
Valley Forge, PA
ISSN :
1080-7225
Print_ISBN :
0-7803-7094-5
Type :
conf
DOI :
10.1109/AUTEST.2001.948942
Filename :
948942
Link To Document :
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