Title :
Electrical performance analysis of a three-dimensional package
Author :
Ahn, Seung-ho ; Lee, Kyung-Sun ; Oh, Se-Yong ; Miersch, Ekkehard
Author_Institution :
Package Dev., Samsung Electron. Co., Kiheung, South Korea
Abstract :
Three-dimensional packaging is considered to offer a solution for high packaging density and enhanced electrical performance, which are required for the present and future electronic systems. A new type of three-dimensional package was recently developed. These were named “memory cubes”, in which thin small outline J-leaded packages or thin quad flat J-leaded packages were stacked, and electrically interconnected by soldering of the outer leads. Analyses of electrical performances of the memory cubes as the main memories in a computer system were made through the electrical simulations of a 4 Mb×9 DRAM memory cube and an equivalent 4 Mb×9 DRAM single inline memory module. Electrical simulation showed that memory cube reduced the capacitance load of the longest on-board nets of typical memory board by 5% to 10%, reduced the reflection behavior of these nets by its lumped load character, and resulted in an overall driver-to-receiver net performance improvement versus the equivalent single inline memory module by about 15%
Keywords :
DRAM chips; capacitance; delays; integrated circuit packaging; soldering; 4 Mbit; DRAM; capacitance load; driver-to-receiver net performance; electrical performance analysis; electrical simulation; lumped load character; memory cubes; packaging density; reflection behavior; single inline memory module; soldering; thin quad flat J-leaded packages; thin small outline J-leaded packages; three-dimensional package; Analytical models; Capacitance; Computational modeling; Computer simulation; Electronics packaging; Lead; Performance analysis; Random access memory; Reflection; Soldering;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
DOI :
10.1109/IEMT.1995.526102