Integrated circuit test sensors using semiconducting nanotubes

This paper describes unique research efforts relating, to the development of semiconducting nanotubes for use within integrated circuits as an aid in determining IC functionality and operational status. This is accomplished by assessing both the electrical and chemical properties of the device through the use of unique carbon nanotube-based sensors specially designed for this purpose. Theoretical issues associated with the design and application of nanotube-based devices in test applications are described, along with progress to date with respect to development issues, and future plans for research and development. This is part of a larger research effort for testing printed circuit boards independent of traditional automatic test equipment using nanotechnology-based molecular test equipment embedded within integrated circuits. Our goal is facilitate circuit board and IC self-diagnosis and reporting to test personnel entirely through visual means - without any connections to or requirements for ATE or external (outside the IC or circuit board) test and diagnostic equipment