Visualization interface for AFM-based nano-manipulation

In this paper, ideal interface characteristics for nano scale object manipulation using an atomic force microscope (AFM) is discussed. Nano manipulation technology using a scanning probe microscope such as an AFM or a scanning tunneling microscope (STM) has been introduced recently. Nano world physics is different from the macro world such that the gravity can be ignored while the influences of sticking forces such as the capillary or the van der Waals forces are dominant. Furthermore, precise tip position control in the z direction is important in order to not breaking the tip or the samples. Depending on the experimental results, besides graphical displays, the visualization of the force value is important to control the z position