DocumentCode :
3466824
Title :
Measurements Of Em Bias At Ku And C Bands
Author :
Melville, W.K. ; Arnold, David V. ; Stewart, Rebert H. ; Keller, William C. ; Kong, Jin A. ; Jessup, Andrew ; Lamarre, Eirc
Author_Institution :
Massachusetts Institute of Technology
fYear :
1990
fDate :
24-26 Sep 1990
Firstpage :
181
Lastpage :
186
Keywords :
Oceans; Radar cross section; Radar measurements; Radar scattering; Rough surfaces; Sea measurements; Sea surface; Spaceborne radar; Surface roughness; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
OCEANS '90. Engineering in the Ocean Environment. Conference Proceedings
Type :
conf
DOI :
10.1109/OCEANS.1990.584756
Filename :
584756
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3466824
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