DocumentCode :
3466978
Title :
Reliability of novel die attach adhesive for snap curing
Author :
Galloway, David P. ; Grosse, Michael ; Nguyen, My N. ; Burkhart, A.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
fYear :
1995
fDate :
2-4 Oct 1995
Firstpage :
141
Lastpage :
147
Abstract :
Novel adhesive, using in-line process, has been shown to reduce adhesive cure cycle time from 70 minutes to as little as 44 seconds at 160°C. Throughput improvement of 60% using existing box ovens and no increase in floor space has been confirmed on production equipment. The adhesive is based upon a modified cyanate ester resin, which cures to form a triazine polymer with excellent temperature stability and unique moisture properties. It generates 75% less outgassing during cure than typical snap sure epoxies, which reduces contamination of the chip, leadframe and oven chamber. Live device reliability, equivalent to standard box oven, has been demonstrated for the new snap cure adhesive using in-line cure, as well as, fast box oven process. Material, processing and qualification data is summarized and compared to epoxies for analog and logic ICs packaged in SOIC, PDIP, and PLCC body styles. The material has been fully qualified and is in production use
Keywords :
adhesion; integrated circuit packaging; integrated circuit reliability; microassembling; ovens; plastic packaging; production testing; 160 degC; 44 s; PDIP; PLCC body styles; SOIC; adhesive cure cycle time; box ovens; cyanate ester resin; die attach adhesive; in-line cure; live device reliability; moisture properties; outgassing; plastic packaging; production equipment; qualification data; snap curing; temperature stability; triazine polymer; Curing; Microassembly; Moisture; Ovens; Polymers; Production equipment; Resins; Stability; Temperature; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
Type :
conf
DOI :
10.1109/IEMT.1995.526106
Filename :
526106
Link To Document :
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