• DocumentCode
    3467032
  • Title

    Single-Chip CMOS Analog Sensor-Conditioning ICs with Integrated Electrically-Adjustable Passive Resistors

  • Author

    Landsberger, Leslie ; Grudin, Oleg ; Frolov, Gennadiy ; Huang, Zhengrong ; Salman, Saed ; Tsang, Tommy ; Renaud, Mathieu ; Zhang, Bowei

  • Author_Institution
    Microbridge Technol., Montreal, QC
  • fYear
    2008
  • fDate
    3-7 Feb. 2008
  • Firstpage
    586
  • Lastpage
    638
  • Abstract
    We demonstrate single-chip analog sensor-conditioning with integrated electrically-adjustable passive resistors, allowing adjustment by the sensor-system assembler, without the drawbacks of digital conditioning. Adding a rudimentary bulk-silicon cavity-etch to a standard 1mum CMOS process enables a group of innovations for thermally-isolated adjustable resistors, called RejustorsTM.
  • Keywords
    CMOS analogue integrated circuits; resistors; silicon; CMOS analog sensor; Rejustors; analog sensor-conditioning; electrically-adjustable passive resistors; integrated passive resistors; rudimentary bulk-silicon cavity-etch; sensor-system assembler; single chip; thermally-isolated adjustable resistors; Analog circuits; Annealing; CMOS process; Coupling circuits; Gain measurement; Micromechanical devices; Microstructure; Resistors; Semiconductor device measurement; Sensor systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-2010-0
  • Electronic_ISBN
    978-1-4244-2011-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2008.4523319
  • Filename
    4523319