Title :
1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)
Abstract :
The following topics were discussed: radiation damage and single event effects; SDRAM and FPGA; PROM and CMOS circuits; plastic encapsulation; testing techniques and radiation tolerance in space applications
Keywords :
CMOS integrated circuits; PROM; SRAM chips; encapsulation; field programmable gate arrays; integrated circuit testing; plastic packaging; radiation hardening (electronics); space vehicle electronics; CMOS circuits; FPGA; PROM; SDRAM; plastic encapsulation; radiation damage; radiation tolerance; single event effects; space applications; testing techniques;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA, USA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816029
