• DocumentCode
    3467799
  • Title

    Inspection of short fault in power-plane with irregular and perforated shapes [MCMs]

  • Author

    Chao, Fang-Lin ; Wu, Ruey-Beei

  • Author_Institution
    Da-Yeh Inst. of Technol., Chung-Hwa, Taiwan
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    170
  • Lastpage
    175
  • Abstract
    The inspection of short fault in the power plane with irregular and perforated shapes is discussed in this study. Finite element method is utilized in calculating the normalized potential distribution of an irregular and perforated plane. Current source is applied on two diagonal corners of the power plane. The desired short fault position is then determined by the intersection of two zero voltage contour lines obtained in two different test setups. The short fault can be determined by as few as four measurements. The current driving points are also utilized as voltage sensing points. Although the accuracy is not as good as internal measurements, it can provide a convenient way for quick estimation
  • Keywords
    electronic equipment testing; fault diagnosis; finite element analysis; inspection; integrated circuit packaging; multichip modules; MCMs; current driving points; diagonal corners; finite element method; irregular shapes; normalized potential distribution; perforated shapes; power-plane; short fault; test setups; voltage sensing points; zero voltage contour lines; Chaos; Costs; Finite element methods; Inspection; Manufacturing; Multichip modules; Nonhomogeneous media; Shape; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-2996-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.526110
  • Filename
    526110