DocumentCode :
3467799
Title :
Inspection of short fault in power-plane with irregular and perforated shapes [MCMs]
Author :
Chao, Fang-Lin ; Wu, Ruey-Beei
Author_Institution :
Da-Yeh Inst. of Technol., Chung-Hwa, Taiwan
fYear :
1995
fDate :
2-4 Oct 1995
Firstpage :
170
Lastpage :
175
Abstract :
The inspection of short fault in the power plane with irregular and perforated shapes is discussed in this study. Finite element method is utilized in calculating the normalized potential distribution of an irregular and perforated plane. Current source is applied on two diagonal corners of the power plane. The desired short fault position is then determined by the intersection of two zero voltage contour lines obtained in two different test setups. The short fault can be determined by as few as four measurements. The current driving points are also utilized as voltage sensing points. Although the accuracy is not as good as internal measurements, it can provide a convenient way for quick estimation
Keywords :
electronic equipment testing; fault diagnosis; finite element analysis; inspection; integrated circuit packaging; multichip modules; MCMs; current driving points; diagonal corners; finite element method; irregular shapes; normalized potential distribution; perforated shapes; power-plane; short fault; test setups; voltage sensing points; zero voltage contour lines; Chaos; Costs; Finite element methods; Inspection; Manufacturing; Multichip modules; Nonhomogeneous media; Shape; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
Type :
conf
DOI :
10.1109/IEMT.1995.526110
Filename :
526110
Link To Document :
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