Title :
Radiation effects in a fixed-point digital signal processor
Author :
Crain, S.H. ; Velazco, R. ; Alvarez, M.T. ; Bofill, A. ; Yu, P. ; Koga, R.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
Abstract :
Radiation effects in a fixed-point digital signal processor (DSP) from Texas Instruments were studied. Single event upset, single event snapback and total ionizing dose effects were observed and some comparisons to other studies of floating-point DSPs are made
Keywords :
digital signal processing chips; fixed point arithmetic; integrated circuit testing; radiation hardening (electronics); DSP; Texas Instruments; fixed-point digital signal processor; floating-point DSPs; radiation effects; single event snapback; single event upset; testing; total ionizing dose effects; Aerospace testing; Circuit testing; Digital signal processing; Digital signal processors; Instruments; Integrated circuit testing; Laboratories; Particle beam measurements; Radiation effects; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816053
