Title :
Radiation testing results of COTS based space microcircuits
Author :
Layton, P. ; Anthony, H. ; Boss, R. ; Hall, N. ; Hsu, P. ; Land, C. ; Meraz, F. ; LePage-Woodie, C. ; Luy, J. ; Strobel, D.
Author_Institution :
Space Electron. Inc., San Diego, CA, USA
Abstract :
Single Event Effects and Total Ionizing dose data collected by SEi for Commercial off the Shelf (COTS) microcircuits are presented. The data was collected for evaluation of these devices for commercial space programs
Keywords :
integrated circuit testing; radiation hardening (electronics); space vehicle electronics; COTS space microcircuit; radiation testing; single event effect; total ionizing dose; Circuit testing; Cobalt; Cyclotrons; Integrated circuit testing; Laboratories; Manufacturing; Performance evaluation; Protection; Single event upset; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop, 1999
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-5660-8
DOI :
10.1109/REDW.1999.816057
