Title :
Spin-Current Shot Noise in Spin Transitors
Author :
He, Yuhui ; Hou, Danqiong ; Liu, Xiaoyan ; Han, Ruqi
Author_Institution :
Dept. of Microelectron., Peking Univ., Beijing
Abstract :
In this paper, we derive a general expression for the zero-frequency-limit spin-current shot noise in spin transistors. We find that the noise in one lead is caused by spin-resolved transmissions from the other lead to this lead and the interferences of these transmissions. Our numerical results demonstrate that the spin-current shot noise will change periodically with the channel length, and oscillate with the spin-momentum interaction coefficient. Besides, it will become saturated for large source-drain bias. The knowledge we gain from this study will help researchers to evaluate the spin-current shot noise in the future spintronic devices
Keywords :
magnetoelectronics; shot noise; spin transistors; spin transitors; spin-momentum interaction coefficient; spin-resolved transmissions; zero-frequency-limit spin-current shot noise; Conductors; Electrodes; Electrons; FETs; Green´s function methods; Interference; Magnetoelectronics; Semiconductor device noise; Thermal conductivity; Voltage;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306689