Title : 
Curvature effects on propagation in cardiac tissue
         
        
            Author : 
Comtois, P. ; Vinet, A.
         
        
            Author_Institution : 
Res. Centre, Hopital du Sacre-Coeur, Montreal, Que., Canada
         
        
        
        
        
            Abstract : 
Simulations of reentry in 1D, 2D and 3D ionic models of cardiac excitable tissue have shown that the APD(DIA) curve is a major determinant of the stability of the propagation. Curvature is also an important factor in extended tissue and kinematical (KIN) models including K and rhythm dependence of Θ have been proposed. These models are incomplete since they do not include the effect of APD on the propagation. The authors´ objective was to find functions expressing the effect of K and DIA on Θ and APD, and to use these them to construct a more complete KIN model of propagation in 2D medium. The Θ(K,DIA) and APD(K,DIA) were obtained by fitting the results of simulations with a BRT ionic model, using an approximation of the 2D diffusion equation allowing a systematic exploration of K and DIA. The functions were used in a KIN model describing the propagation of period-1 solutions in a 2D ring of tissue
         
        
            Keywords : 
bioelectric phenomena; cardiology; physiological models; 1D ionic model; 2D ionic model; 2D tissue ring; 3D ionic model; cardiac excitable tissue; cardiac tissue propagation; curvature effects; extended tissue model; kinematical model; rhythm dependence; Biomembranes; Boundary conditions; Cardiac tissue; Convergence; Equations; Financial advantage program; Level set; Morphology; Rhythm; Stability;
         
        
        
        
            Conference_Titel : 
[Engineering in Medicine and Biology, 1999. 21st Annual Conference and the 1999 Annual Fall Meetring of the Biomedical Engineering Society] BMES/EMBS Conference, 1999. Proceedings of the First Joint
         
        
            Conference_Location : 
Atlanta, GA
         
        
        
            Print_ISBN : 
0-7803-5674-8
         
        
        
            DOI : 
10.1109/IEMBS.1999.802204