Title :
Thermomechanical stress-strain hysteresis of Sn-Bi eutectic solder alloy
Author :
Raeder, C.H. ; Felton, L.E. ; Messier, R.W. ; Coffin, L.F., Jr.
Author_Institution :
Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
This study details a thermomechanical testing technique, used in an on-going program, to measure stress-strain hysteresis of solder joints. The apparatus closely approximates the mechanical conditions solder joints experience in electronics packages subjected to cyclic temperature changes. The test assembly is composed of a small load frame, an insert of differing thermal expansion coefficient, and a solder joint. Strain gages on the load frame and a calibration procedure conducted prior to testing allow shearing stress and strain in the solder joint to be obtained during testing. Some thermomechanical deformation behavior of SnBi eutectic solder is reported and discussed
Keywords :
bismuth alloys; calibration; deformation; fatigue; fatigue testing; hysteresis; materials testing; soldering; stress-strain relations; thermal stresses; tin alloys; Sn-Bi; Sn-Bi eutectic solder alloy; calibration procedure; cyclic temperature changes; electronic packages; load frame; mechanical conditions; shearing stress; solder joints; strain gages; test assembly; thermomechanical deformation behavior; thermomechanical stress-strain hysteresis; thermomechanical testing technique; Assembly; Capacitive sensors; Electronic packaging thermal management; Hysteresis; Soldering; Stress measurement; Temperature; Testing; Thermal expansion; Thermomechanical processes;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
DOI :
10.1109/IEMT.1995.526124