• DocumentCode
    3468589
  • Title

    The impact of liquid cooling on 3D multi-core processors

  • Author

    Jang, Hyung Beom ; Yoon, Ikroh ; Kim, Cheol Hong ; Shin, Seungwon ; Chung, Sung Woo

  • Author_Institution
    Div. of Comput. & Commun. Eng., Korea Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    4-7 Oct. 2009
  • Firstpage
    472
  • Lastpage
    478
  • Abstract
    Recently, 3D integration has been regarded as one of the most promising techniques due to its abilities of reducing global wire lengths and lowering power consumption. However, 3D integrated processors inevitably cause higher power density and lower thermal conductivity, since the closer proximity of heat generating dies makes existing thermal hotspots more severe. Without an efficient cooling method inside the package, 3D integrated processors should suffer severe performance degradation by dynamic thermal management as well as reliability problems. In this paper, we analyze the impact of the liquid cooling on a 3D multi-core processor compared to the conventional air cooling. We also evaluate the leakage power consumption and the lifetime reliability depending on the temperature of each functional unit in the 3D multi-core processor. The simulation results show that the liquid cooling reduces the temperature of the L1 instruction cache (the hottest block in this evaluation) by as much as 45 degrees, resulting in 12.8% leakage reduction, on average, compared to the conventional air cooling. Moreover, the reduced temperature of the L1 instruction cache also improves the reliability of electromigration, stress migration, time-dependent dielectric breakdown, thermal cycling, and negative bias temperature instability significantly.
  • Keywords
    cooling; multiprocessing systems; power aware computing; reliability; thermal management (packaging); 3D integrated processor; 3D multicore processor; L1 instruction cache; dynamic thermal management; electromigration reliability; leakage power consumption; lifetime reliability; liquid cooling method; negative bias temperature instability; stress migration; thermal cycling; time dependent dielectric breakdown; Energy consumption; Liquid cooling; Multicore processing; Packaging; Power generation; Temperature; Thermal conductivity; Thermal management; Thermal stresses; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2009. ICCD 2009. IEEE International Conference on
  • Conference_Location
    Lake Tahoe, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4244-5029-9
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2009.5413115
  • Filename
    5413115