DocumentCode
3468760
Title
2005 6th International Conference on ASIC Proceedings
Volume
2
fYear
2005
fDate
24-27 Oct. 2005
Abstract
The following topics are dealt with: VLSI design; VLSI circuits; analog, mixed signal and RF circuits; testing technology and design for testability; programmable devices; physical design; synthesis and system design, verification; modeling and simulation
Keywords
VLSI; analogue integrated circuits; application specific integrated circuits; design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; programmable circuits; radiofrequency integrated circuits; ASIC; RF circuits; VLSI design; analog circuits; circuit synthesis; design for testability; mixed signal circuits; physical design; programmable devices; system design verification; testing technology;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location
Shanghai
Print_ISBN
0-7803-9210-8
Type
conf
DOI
10.1109/ICASIC.2005.1611373
Filename
1611373
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