Title :
A Time Dependent Dielectric Breakdown(TDDB) Prognostic Monitor
Author :
Lv, Yu-Bing ; Zhuang, Yiqi ; Li, XiaoMing ; Bai, Hao ; Wang, DangHui
Author_Institution :
Dept. of Microelectron., Xidian Univ., Xi´´an
Abstract :
A TDDB monitoring circuit structure for an on-chip end-of-life indicators disclosed here, which can be integrated and degraded with the device, and give an alarm when the device needs replacing. This is estimated down time of the system where this IC is used and this circuit structure only needs a very small area
Keywords :
electric breakdown; indicators; integrated circuit testing; integrated circuit structure; monitoring circuit structure; on-chip end-of-life indicators; prognostic monitor; time dependent dielectric breakdown; Acceleration; Capacitors; Circuits; Condition monitoring; Dielectrics; Electric breakdown; Microelectronics; Stress; Switches; Voltage;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306067
