Title :
A thin-film-on-silicon acoustooptical modulator with multi-mode behavior
Author :
Schmidt, H. ; Weihnacht, M. ; Wobst, R.
Author_Institution :
Corp. Res. & Dev., Robert Bosch GmbH, Stuttgart, Germany
Abstract :
A thin film approach of an acoustooptical Bragg modulator on silicon substrates has been investigated. We used a piezoelectric ZnO layer for the SAW excitation and a light guiding oxynitride film separated by a lower refractive SiO2-layer from the high index silicon substrate and zinc oxide film. The optical system was designed for a wavelength of 632.8 nm. Calculations for the optical field distribution yielded a 15 μm light guiding structure. Multi-mode acoustooptical interaction was concluded from numerical evaluation of SAW excitation and depth distribution of strain profiles for this 15 μm optical waveguide on (001) [110] silicon covered by an 8 μm ZnO top layer. By experiment, the Bragg reflection of the optical wave has been observed really in four different frequency regions due to the existence of three Sezawa modes additionally to the Rayleigh mode
Keywords :
II-VI semiconductors; Rayleigh waves; acousto-optical modulation; silicon; silicon compounds; surface acoustic wave transducers; zinc compounds; 15 mum; 50 to 250 MHz; 632.8 nm; 8 mum; Bragg reflection; Rayleigh mode; SAW excitation; Sezawa modes; Si; Si substrates; SiO2; ZnO; ZnO-SiO2-Si; acoustooptical Bragg modulator; frequency regions; light guiding oxynitride film; light guiding structure; multi-mode acoustooptical interaction; multi-mode behavior; optical field distribution; optical system; piezoelectric ZnO layer; strain profiles; thin-film-on-silicon acoustooptical modulator; Optical films; Optical refraction; Optical waveguides; Piezoelectric films; Semiconductor films; Semiconductor thin films; Silicon; Substrates; Surface acoustic waves; Zinc oxide;
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2940-6
DOI :
10.1109/ULTSYM.1995.495699