• DocumentCode
    3468849
  • Title

    Leakage Power Modeling Method for SRAM Considering Temperature, Supply Voltage and Bias Voltage

  • Author

    Zhang, Feng ; Luo, Rong ; Liu, Yongpan ; Wang, Hui ; Yang, Huazhong

  • Author_Institution
    Dept. of Electron. Eng., Tsinghua Univ., Beijing
  • fYear
    2006
  • fDate
    23-26 Oct. 2006
  • Firstpage
    1180
  • Lastpage
    1182
  • Abstract
    In this paper, an accurate power estimation method for SRAM memories based on structures is proposed. Furthermore, based on this power estimation method, a leakage power model for SRAM considering temperature, supply voltage and bias voltage is also proposed. Its maximum error is within 7%
  • Keywords
    SRAM chips; leakage currents; power supply circuits; SRAM memories; bias voltage; leakage power modeling; power estimation; supply voltage; temperature; Circuits; Computer errors; Energy consumption; Power engineering and energy; Power system modeling; Random access memory; Temperature dependence; Temperature sensors; Voltage; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0160-7
  • Electronic_ISBN
    1-4244-0161-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2006.306069
  • Filename
    4098360