Title :
Time and polarization resolved ultrasonic measurements using a lensless line-focus transducer
Author :
Hsu, N.N. ; Xiang, D. ; Fick, S.E. ; Blessing, G.V.
Author_Institution :
Div. of Autom. Production Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
We have developed a transducer which allows the benefits of Line-Focus Beam (LFB) acoustic microscopy to be realized over large areas, using a conventional pulser-receiver. Experimental evidence is presented to show that the transducer is correctly modeled in detail by Green´s function theory, and that all relevant wave speeds can also be predicted using a much simpler geometrical ray model. Data obtained by simply rotating the transducer a fixed distance above the specimen are presented using grey-scale plots which establish the ease with which anisotropy can be revealed. Finally, a grey scale plot of rotational-scan data recast in terms of velocity is shown to demonstrate the simultaneous detection of both surface and pseudo-surface waves in the same crystallographic orientation of a silicon specimen
Keywords :
Green´s function methods; acoustic microscopy; acoustic pulses; piezoelectric transducers; polymer films; surface acoustic wave transducers; ultrasonic transducers; ultrasonic velocity measurement; Green´s function theory; PVDF transducer; SAW measurement; Si; Si specimen; crystallographic orientation; geometrical ray model; grey-scale plots; lensless line-focus transducer; line-focus beam acoustic microscopy; orientation dependent velocity measurements; polarization resolved ultrasonic measurements; pseudo-surface wave detection; pulser-receiver; rotational-scan data; surface wave detection; time domain measurements; time resolved ultrasonic measurements; Acoustic beams; Acoustic measurements; Acoustic pulses; Acoustic transducers; Polarization; Predictive models; Solid modeling; Time measurement; Ultrasonic transducers; Ultrasonic variables measurement;
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2940-6
DOI :
10.1109/ULTSYM.1995.495704